John Perrino (CSIF) : TEM fly brain
Electron Microscopes
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Instruments
TEM: JEOL JEM1400
- Transmission Electron Microscope
- High Resolution Imaging
- Gatan OneView sCMOS Image Acquisition with drift correction
- High Tilt Series Tomographic Images
- For data published using this microscope you must acknowledge NIH ORIP: 1 S10 OD028536-01
Location: Beckman Center, Room B001
SEM: Zeiss Sigma FESEM
- Scanning Electron Microscope
- Schottky Field Emission source
- Max accelerating Voltage is 30kV
- Sample size as large as 20cm
Location: Beckman Center, Room B051