Atomic Force Microscope : Bio-AFM
Atomic Force Microscopes (AFMs) are a type of Scanning Probe Microscope SPM that evaluates the atomic forces between a tiny probe and the surface to gather data.
NanoWizard V NWV BioAFM
The JPK NanoWizard V (NWV) AFM available at CSIF is a state-of-the-art instrument that combines high spatio-temporal resolution with a large scan area, intuitive software, automated setup steps, a comprehensive suite of the latest imaging modes, and seamless integration with optical microscopy. The NWV excels at performing in situ measurements in liquid environments with correlative optical imaging. The versatile NWV is equipped to measure high resolution topography and mechanical properties of samples ranging from thin films and polymers to tissue sections, cells and biomolecules such as DNA. The NWV can also image dynamic molecular events, from molecular dynamics of proteins to kinetics of crystal growth and dissolution!
Features:
● Automated setup steps for fast and easy operation with fully motorized laser and detector alignment.
● Large sample scan range of up to 200x200μm² with HybridStage.
● Easily obtain mechanics of sticky, corrugated, or rough samples such as polymers, tissues, and hydrogels with a Z range of up to 200μm.
● Easy correlative optical and AFM measurements for both transparent/non-transparent samples.
● AFM integration with either: Inverted Microscope, Zeiss AxioObserver: 10x, 20x, 40x phase, 63x oil, and 100x oil objectives with GFP, RFP, and DAPI fluorescent channels
● Stereo Microscope, Zeiss AxioZoom: 0.5X with GFP, RFP, and DAPI fluorescent channels.
● Excels at in situ liquid measurements with sample heating (up to 60°C), perfusion, and CO2 control (from 0% to 20% volume) capabilities. High resolution imaging in air.
● Image dynamics molecular events with the fast scan capability: scan speed up to 200 lines/sec with up to 1.5μm height range.
● Complete suite of AFM modes for topography, mechanics, surface properties, force spectroscopy, and viscoelastic measurements:
○ PeakForce-QI
○ PeakForce Tapping®
○ QI mode
○ TappingMode™ with PhaseImaging™
○ Contact Mode with Lateral Force
○ Fast Force Mapping
○ Force spectroscopy
● Dedicated viscoelastic property mapping software for sine modulation measurements at defined frequencies.
● Equipped with Förster resonance energy transfer (FRET) capabilities to use FRET as a sensor for real-time in-situ proximity monitoring. With GFP/RFP and CFP/YFP pairs.
Contact and Location
Nadia Makarova nmak@stanford.edu, Shriram Center, Room B023
Bruker BioScope Resolve BioAFM
- Resolving Nanoscale Structures on Living Cells
- Molecular High-Resolution Imaging
- Real-Time Cell Topography, Modulus, and Fluorescence Observation using Zeiss LSM900 AiryScan
- Quantitative Cell Mechanics and Molecular Force Spectroscopy Data
- For all data published using this microscope you must acknowledge NIH ORIP: 1 S10 OD021514-01
Contact and Location
Nadia Makarova nmak@stanford.edu, Shriram Center, Room B023
