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Electron Microscopes

Instruments

TEM: JEOL JEM1400

  • Transmission Electron Microscope
  • High Resolution Imaging
  • Digital Image Acquisition
  • High Tilt Series Tomographic Images

RESERVE THIS MICROSCOPE

LOCATION: Beckman Center, Room B001


 

SEM: Hitachi S-3400N VP 

  • Scanning Electron Microscope
  • Accelerating voltages up to 30kV
  • Sample up to 25cm in diameter
  • Hydrated samples
  • Variable pressure: observation from 6 to 270Pa

RESERVE THIS MICROSCOPE

LOCATION: Shriram Center, Room B023


 

SEM: Zeiss Sigma FESEM

  • Scanning Electron Microscope
  • Schottky Field Emission source
  • Max accelerating Voltage is 30kV
  • Sample size as large as 20cm

RESERVE THIS MICROSCOPE

LOCATION: Beckman Center, Room B051